Efficient Trace Signal Selection using Augmentation and ILP Techniques

K. Rahmani, P. Mishra, and S. Ray

In M. Budnik, S. A. Alam, and P. Wright editors, 15th International Symposium on Quality Electronic Design (ISQED 2014), Santa Clara, CA, USA, March 2014, pages 148-155. IEEE.

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Abstract

A key problem in post-silicon validation is to identify a small set of traceable signals that are effective for debug during silicon execution. Most signal selection techniques rely on a metric based on circuit structure. Simulation-based signal selection is promising but have major drawbacks in computation overhead and restoration quality. In this paper, we propose an efficient simulation-based signal selection technique to address these bottlenecks. Our approach uses (1) bounded mock simulations to determine state restoration effectiveness, and (2) an ILP-based algorithm for refining selected signals over different simulation runs. Experimental results demonstrate that our algorithm can provide significantly better restoration ratio (up to 515%, 51% on average) compared to the state-of-the-art techniques.

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