Protocol-Guided Analysis of Post-silicon Traces Under Limited Observability

H. Zheng, Y. Cao, S. Ray, and J. Yang

In P. Wright, S. Mukhopadhyay, and B. Cline editors, 17th International Symposium on Quality Electronic Design (ISQED 2016), Santa Clara, CA, USA, March 2016. IEEE.

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Abstract

We consider the problem of reconstructing system-level behavior of an SoC design from a partially observed signal trace. Solving this problem is a critical activity in post-silicon validation, and currently depends primarily on human creativity and insights. In this paper, we provide an algorithm to automatically infer system-level transactions from incomplete, ambiguous, and noisy trace data. We demonstrate the approach on a multicore virtual platoform developed within the GEM5 environment.

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